Scanning speed phenomenon in contact-resonance atomic force microscopy
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Authors
Glover, Christopher C.
Killgore, Jason P.
Tung, Ryan C.
Issue Date
2018
Type
Article
Language
Keywords
atomic force microscope , contact resonance , liquid , phenomenon , scan speed
Alternative Title
Abstract
This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of this phenomenon is necessary to conduct accurate quantitative imaging using contact-resonance AFM, and other contact-mode AFM techniques, at higher scan speeds. A squeeze film hydrodynamic theory is proposed to explain this phenomenon, and model predictions are compared against the experimental data.
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Citation
Glover, C. C., Killgore, J. P., & Tung, R. C. (2018). Scanning speed phenomenon in contact-resonance atomic force microscopy. Beilstein Journal of Nanotechnology, 9, 945�"952. doi:10.3762/bjnano.9.87
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License
Creative Commons Attribution 4.0 International
Journal
Volume
Issue
PubMed ID
ISSN
2190-4286